The PXI platform continues its explosive growth with many new product introductions. New products introduced in the last three months include (listed in the order received):
Pickering Interfaces Expands Range of 16 Amp PXI Switching Solutions
16 Amp PXI power multiplexer (model 40-662) – available in seven configurations ranging from 4-off 2:1 multiplexers to 1-off 16:1 multiplexer.
16 Amp PXI power matrix (model 40-552) – available in four configurations with matrix sizes of 8x2 and 4x4 and the ability to expand the matrix size with the Y-Axis loop-thru connections. For example, 8x4, 12x4, 16x4, etc. (with 4x4 matrices) or 16x2, 24x2, 32x2, etc. (with 8x2 matrices).
NI PXIe-1085 18-Slot 3U PXI Express Chassis - Up to 24 GB/s
Featuring PCI Express Generation 3 technology, the NI PXIe-1085 is designed for high-throughput applications. It is capable of 8 GB/s of per-slot bandwidth and 24 GB/s of system bandwidth, enabled by PCIe x8 Gen 3 links to every slot.
• PXI Express with PCIe Gen 3 Technology
• 16 hybrid slots; 1 PXIe system timing slot; 1 System Slot
Keysight High-Speed, Multi-Site PXIe Digital Stimulus/Response
A new high-speed, 16-channel PXIe digital stimulus/response module (M9195A) was introduced featuring a powerful pattern cyclizer technology enabling unique on-the-fly pattern creation for single site or 4 independent multi-sites.
Avionics Interface Technologies New PXIe ARINC 664 and Avionics High Speed Ethernet Test Instrument
Building upon AIT’s complete suite of high speed ARINC 664 and Avionics Ethernet test tools, the new PXIe-664 provides dual 10/100/1000 Mbit Ethernet interfaces and supports testing and simulation of ARINC 664 and other high speed avionics Ethernet networks.
GuideTech’s GT668PXIe CTIA
GuideTech’s GT668PXIe CTIA “Continuous Time Interval Analyzer” 4M m/s with 0.9pS resolution delivering new capabilities & much higher performance. The GT668PXIe CTIA is the successor GT658CTIA, which are in use worldwide at scientific labs, Satellite Tracking, Semiconductor Test, Optical Test, monitoring of atomic clocks, production test, etc...
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