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From Bob Helsel, Editor of the PXI Newsletter:

Welcome to the September 2016 edition of the PXI Newsletter.  Our intent is to educate and inform you about how the PXI standard is being used in modular test systems for a wide variety of industries.

In the New PXI Products section, we are showcasing PXI products recently released by members of the PXI Systems Alliance.

Our thanks go to AIT, the sponsor for this month's issue.

Visit for more information.


Testing High Speed Ethernet
& Fibre Channel Avionics Switches

by Troy Troshynski, Avionics Interface Technologies
(A Division of Teradyne)

Modern avionics systems are increasingly employing the use of high speed serial data networks. High capacity Ethernet and Fibre Channel switch fabrics are commonly found at the core of theses avionics networks and it is typical to find a mix of both copper and optical media interfaces as well as multiple data link bit rates within a single aircraft system. As these switching fabrics become integral pieces of avionic suites, functional test system must be developed with the capacity to replicate the combined data streams of multiple avionics end points when the fabric is off the aircraft and becomes the Unit Under Test (UUT).

As avionics applications have grown in complexity and sophistication, the avionics networks that support them have had to also grow to provide support for increased data rates. As a result avionics communications buses, such as ARINC 629 and MIL-STD-1553, have given way to high speed switched network technologies based on commercial network technologies like Ethernet and Fibre Channel.


PXI Digital Pattern Instruments Bring Semiconductor ATE-Class Digital to the Open PXI Platform

Submitted by National Instruments

The PXI Digital Pattern Instrument delivers ATE-class digital to the industry-standard PXI platform for testing a broad range of RF and mixed-signal integrated circuits (ICs). The NI PXI platform and NI Semiconductor Test System (STS) are an ideal platform for characterization and production test of RF and mixed-signal ICs from RF front ends and power management ICs to transceivers and Internet of Things systems on chip with built-in connectivity and sensors.

1. Introduction

The PXI Digital Pattern Instrument combines the function of pin electronics hardware for digital interfacing and DC parametric measurements with digital timing flexibility by bursting digital patterns based on vectors with defined timing sets and levels. Using various time sets on PXI Digital Pattern Instruments allows for specifying different periods and edge placement from one vector to the next within a pattern.


Benefits of a Flexible Test System Platform

Submitted by Keysight Technologies

As engineers, we develop test systems with various input stimulus, output measurements and different methods of control. More advanced test systems may include data processing and results presentation in addition to the data collection from the device under test. Familiar challenges include fast test completion times, building for a limited space or for limited power, and to remain within a financial budget.  A solid test development plan can provide the details required for approval and development of a well thought out test system. However, what happens to this perfectly defined test system when more channels are required, or new measurement types are needed, or a different series of signals must be monitored because the device under test has changed? 

We live in a dynamic world – and things change quickly. We don’t always have the luxury of thinking of the next step, or next project’s test requirements. Having built-in benefits of a flexible test system – one that can be adapted to changes - are presented in this article.


Thanks to all our readers.
Bob Helsel, Editor

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New PXI Products

The PXI platform continues its explosive growth with many new product introductions. New products introduced in the last three months include (listed in the order received):

AIT PXIe-1553
The PXIe-1553 module is the PXI Express member of AIT’s family of MIL-STD-1553 test and simulation instruments. This module is a 3U PXI Hybrid Slot and PXI Express slot compatible instrument designed to support testing, simulations, monitoring, and analysis of MIL-STD-1553 A/B databuses.

Keysight Gen 3 PXIe Chassis and System Components
Doubling the system bandwidth, compared with Gen 2, the new Gen 3 PXIe chassis and system components improve triggering and power sequencing for multi-chassis and multi-site applications such as MIMO and PA/FEM. 

NI PXIe-6570 Digital Pattern Instrument
The PXIe-6570 is a digital pattern instrument for semiconductor characterization and production test. The device is capable of executing test patterns at up to 100 MHz vector rate with 31 timing sets and numerous opcodes. The PXIe-6570 has four separate source, capture, and history memory resources for multi-site support.

Marvin Test Solutions TS-960e PXIe Semiconductor Test System
Marvin Test Solutions builds on the integrated open-architecture of the TS-900 Semiconductor Test platform with the new TS-960e, offering PXI Express (PXIe) performance and expanded test capabilities for RF devices and SoC applications.

VTI Instuments SentinelEX PXIe Test and Measurement Suite
SentinelEX continues to lead the way in modular test solutions by delivering uncompromised measurement integrity to the heart of every test system: signal switching. The new VTI Instruments PXIe Switching Series by AMETEK is built on 20 years of proven deployment in the most demanding aerospace, defense and automotive applications.

VX Instruments PXIexpress Arbitrary Waveform Generator Family PXIe722x
VX Instruments expands their Flexible Configurable PXI Platform (FlexCPP) based device family with the PXIexpress interface (FlexCPeP). Starting with the PXAe722x Isolated Arbitrary Waveform Generator Family the new devices feature up to two simultaneously working channels with 100 MS/s, 16 Bit resolution and an output voltage up to +30 V or ±15 V. They are available as isolated or non-isolated versions.

Innovative Integration PXIe XMC x8 Lane Adapter Overview
The PXI Express to XMC module adapter allows a standard 75 x 150mm PCIe XMC module to be used in a PXI Express slot. The XMC module must be VITA 42.3-compatible and may support up to eight PCI Express lanes. The adapter is completely transparent to PCI Express. 

VPC Snap-In-Modular (SIM) VTAC
VPC introduces its Snap-In-Modular (SIM) VTAC right angle insert. Capable of speeds of 10+ Gbps, the VTAC right angle insert is ideal for a variety of applications that require a high speed PCB solution.


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