A component of the GENASYS platform, the GX7016 switching subsystem offers a new level of high performance, high density switching for board and system level functional test. Based on the 6U PXI architecture, the GX7016 incorporates a modular switch matrix and multiplexer architecture which supports up to 4608 multiplexed, hybrid I/O pins. Up to 128 external resources can be connected to any of the test system’s receiver I/O pins via a high performance, internal 16 wire matrix bus. For digital test capability, the GX7016’s switching subsystem can be connected to a digital subsystem such as Marvin Test Solutions’ GX5960 digital subsystem, providing hybrid pin capability for each multiplexed I/O pin. Up to 288 digital channels are supported by the switching subsystem.